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Arrow™ UHF

Commercially introduced in 2004, NanoWorld Arrow™ UHF AFM probes have an AFM cantilever capable of resonating with a frequency of up to 2 MHz.

These AFM probes combine outstanding sensitivity with fast scanning ability.

As for all AFM probes of the Arrow™ series, the Arrow™ UHF AFM probes are made from monolithic silicon which is highly doped to dissipate static charge. It is chemically inert and offers a high mechanical Q-factor for high sensitivity.

The Arrow™ UHF AFM probes feature a 35 µm long triangular AFM cantilever and a tetrahedral AFM tip with a height of 3 µm and a radius of curvature smaller than 10 nm.

The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the tip on the area of interest.

The reflex coating (aluminum or gold) on the detector side of the AFM cantilever enhances the reflectance of the laser beam by a factor of 2.5 and prevents light from interfering within the cantilever.

Technical DataValueRange *
Resonance Frequency [MHz] 1.5 0.7 - 2.0
Force Constant [N/m] - -
Cantilever length [µm] 42  
Cantilever width [µm] 35 -
Cantilever thickness [nm] 700 500 - 900
* Typical values
Arrow™ UHF 3D View
Arrow™ UHF AFM probe
3D View
Arrow™ UHF 3D-View (Close up)
Arrow™ UHF AFM probe
3D View (Close up)
Arrow™ UHF Side View
Arrow™ UHF AFM probe
Side View
Arrow™ UHF Front View
Arrow™ UHF AFM probe
Front View